Port1 test beam：Ф120mm

Port2 test beam：Ф600mm

Test Type: Fizeau interferometry

Referencemirror：Port 1  PV：λ/20；Port2  PV：λ/10

Systemaccuracy：CavityPV：λ/10

Systemrepeatability：RMS repeatabilityλ/1000;

Zoom:1X to 6X-Remote controlled

TestWavelength: 632.8nm(Semiconductor tunable laser)

PowerSupply: 210V-230V，40HZ-60HZ;

Optimumoperating temperature: 20℃-25℃；

Size:4800×1500×1090mm

Weight:About 1000Kg

Dualport detection，wide application area

Measurementof large aperture planar element surface

Uniformitymeasurement of optical materials

Surfaceanalysis，Optical data processing

Goodimaging quality and simple structure

Horizontalstructure, two port measurement

Easyto operate,easy to use

Wavelengthtuning analysis system